This review focuses on the three main spectroscopic methods for the characterization of chemically modified oxide surfaces: Diffuse reflectance infrared Fourier transform spectroscopy (DRIFT), cross-polarization, magic-angle spinning nuclear magnetic resonance spectroscopy (CP-MAS NMR) and the related photoelectron spectroscopic techniques (ESCA, XPS). Both molecular (DRIFT, CP-MAS NMR) and elemental (ESCA, XPS) information about the surface can be obtained and these techniques can also be used to characterize the original surface and subsequent modifications, whether they are the result of the formation of chemical bonds or adsorption. Quantitative information can also be obtained from each of the three methods by the use of appropriate standards. The applications and data obtained from these techniques on oxide surfaces can often be applied to other types of materials.