ABSTRACT Spectroscopic ellipsometry is an optical technique for surface, interface and thin film analysis. Its application on thin organic films for determination of their optical properties and microstructure is reviewed. The rotating-analyzer ellipsometer is briefly described and different strategies for interpretation and further analysis of ellipsometric data are discussed in some details. The applications presented are based on research in our own laboratory and include: Protein films; phthalocyanines; and conducting polymers.
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