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Trends in Vacuum Science & Technology
→ Volumes
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Volume
5
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Published in 2002
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Table of Contents
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| 1 |
The mechanism of the formation of the Si(111) 7x7 reconstruction
Pages 1 -
29
Hiroshi Tochihara, Wataru Shimada
Abstract | Buy this article
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| 2 |
Time-of-flight secondary ion mass spectrometry: quantitative approaches
Pages 31 -
43
Liji Huang
Abstract | Buy this article
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| 3 |
X-ray-induced ion desorption from solid surfaces
Pages 45 -
74
Yuji Baba
Abstract | Buy this article
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| 4 |
Spin polarized empty states spectroscopy of thin films and multilayers
Pages 75 -
88
F. Ciccacci, G. Isella, L. Duo, M. Marcon, R. Bertacco
Abstract | Buy this article
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| 5 |
Mechanism of electric field emission from DLC surfaces
Pages 89 -
95
Ahalapitiya H. Jayatissa, Fumio Sato, Nobuo Saito
Abstract | Buy this article
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| 6 |
Growth and optoelectronic properties of hydrogenated nanostructured silicon
Pages 97 -
114
A. Hadjadj
Abstract | Buy this article
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| 7 |
Properties of sol-gel SiO2 materials containing metals and metal oxide particles: a review
Pages 115 -
168
A. Mendoza-Galvan, J. Gonzalez-Hernandez
Abstract | Buy this article
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